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PDF) High density data storage based on the atomic force microscope
nanoHUB.org - Resources: Fundamentals of Metrology and Characterization for Nanotechnology: Watch Presentation
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O2sBa
Full article: High-speed atomic force microscopy for materials science
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DVD OPU based AFM with 100um long cantilever - YouTube
PDF) High density data storage based on the atomic force microscope
